Field ion microscopy the modification of the atomic structure of the materials after strong external exposures

The paper presents the application of direct methods (field ion microscopy and atom probe techniques) to study the modification of the crystal structure of various materials at atomic spatial level after strong external exposures. On the original results shows the possibility of three- dimensional reconstruction of the elemental composition of the materials studied with atomic resolution to study the modification of the atomic structure. It is established that the nature of the crystalline structure of the boundary region of planar defects depends directly on the type of external influence.